Welcome to the 11th IEEE International Conference on dependability in Sensor, Cloud & Big Data System & Applications (DependSys-2025).

IEEE DependSys 2025 conference is the 11th event in the series of conferences which offers a timely venue for bringing together new ideas, techniques, and solutions for dependability and its issues in sensor, cloud, and big data systems and applications. As we are deep into the Information Age, huge amounts of data are generated every day from sensors, individual archives, social networks, Internet of Things, enterprises and Internet in various scales and format which will pose a major challenge to the dependability of our designed systems. As these systems oftentend to become inert, fragile, and vulnerable after a period of running. Effectively improving the dependability of sensor, cloud, big data systems and applications has become increasingly critical.

This conference provides a forum for individuals, academics, practitioners, and organizations who are developing or procuring sophisticated computer systems on whose dependability of services they need to place great confidence. Future systems need to close the dependability gap in face of challenges in different circumstances. The emphasis will be on differing properties of such services, e.g., continuity, effective performance, real-time responsiveness, corruption, anomaly, ability to avoid catastrophic failures, prevention of deliberate privacy intrusions, reliability, availability, sustainability, adaptability, heterogeneity, security, safety, and so on.

Prospective authors are invited to submit their papers to DependSys-2025. All accepted papers are expected to be included in IEEE Xplore and will be indexed by Engineering Index (EI). The authors of selected best papers will be invited post conference to extend their contributions for special issues of prestigious journals to be planned in conjunction with the conference.

Topics of interest include, but are not limited to:

Track 1: Dependability and Security Fundamentals and Technologies

• Concepts, theory, and methodologies
• Dependability of sensor, networks
• Dependability issues in cloud/fog/edge
• Security and privacy
• Security/privacy in cloud/fog/edge
• Artificial intelligence
• Big data foundation and management
• Dependable IoT supporting technologies

• Real-time and critical applications for embedded systems
• Information systems and data management for embedded systems
• Multimedia and consumer electronics applications
• Transportation application: automotive, avionics, etc
• Novel applications for Reconfigurable Computing
• Cloud Computing for mobile systems
• Intelligent sensors
• Pervasive systems

• Distributed computing on embedded devices
• Programming paradigms
• Languages and compilers
• Middleware and virtual machines
• Privacy in mobile and wireless communications
• Privacy in e-commerce and e-government
• Agents and Distributed Computing
• Middleware and Peer-to-Peer Computing
• Offloading computations

• Metrics and measures for safety, trust, faith
• Levels and assessment criteria and authority
• Dependability measurement, modeling
• Dependability evaluation
• Software reliability and verification
• Hardware reliability and verification
• Evaluations and tools

All papers need to be submitted electronically through the conference submission website (https://hpcn.exeter.ac.uk/dependsys/) with PDF format. The materials presented in the papers should not be published or under submission elsewhere. Each paper is limited to 8 pages (or 12 pages with over length charge) including figures and references using IEEE Computer Society Proceedings Manuscripts style (two columns, single-spaced, 10 fonts).

Manuscript Templates for Conference Proceedings can be found at:
https://www.ieee.org/conferences_events/conferences/publishing/templates.html

Once accepted, the paper will be included into the IEEE conference proceedings published by IEEE Computer Society Press (indexed by EI). At least one of the authors of any accepted paper is requested to register the paper at the conference.